Thermal Shock Test Chambers

Sanwood thermal Shock Test Chamber is a device used to test the ability of materials, components and electronic products to withstand rapid temperature changes. It can simulate the sudden temperature changes that products may encounter in actual environments, helping R&D and quality control teams evaluate the reliability and performance of products under harsh conditions.

Thermal Shock Climate Chambers

Horizontal Thermal Shock Test Chamber

Sanwood horizontal two-zone thermal shock test chamber usually consists of two independent slots, one for high temperature environment and the other for low temperature environment, to simulate the impact of thermal shock on items that may be encountered in actual use.

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Three-zones Thermal Shock Test Chamber

Sanwood three-zones thermal shock test chamber is mainly composed of three parts: high temperature zone, low temperature zone and test zone. The sample is placed in the test area to remain stationary, avoiding the mechanical impact that may be caused by the sample movement.

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Two-zone Thermal Shock Test Chamber

Sanwood two-zone thermal shock test chamber is the most suitable test chamber for testing IC chips and small electronic devices. This chamber is designed with two independent control rooms, one for low temperature and one for high temperature.

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Compact Test Chambers

Constant Temperature Humidity Test Chambers

Battery Test Chambers

Thermal Shock Test Chambers

Altitude Test Chambers

Walk-In Test Chambers

AGREE Test Chambers

ESS Test Chamber

High and Low Temperature Chambers

Thermal Shock Test Chambers

Thermal Shock Climate Chambers

Horizontal Thermal Shock Test Chamber

Three-zones Thermal Shock Test Chamber

Two-zone Thermal Shock Test Chamber

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