Highly Accelerated Stress Test System (HAST Chamber)

Sanwood’s Highly Accelerated Stress Test (HAST) Chambers are precision-engineered systems designed to dramatically accelerate the evaluation of moisture resistance and long-term reliability for semiconductors, integrated circuits (ICs), and other moisture-sensitive electronic components. By creating controlled, high-temperature, high-humidity, and high-pressure environments (typically up to 130°C, 85% Relative Humidity, and 2.3 atm), HAST testing simulates years of field exposure in a matter of days or hours, enabling rapid failure mode analysis and design validation.