Sanwood Technology ESS Test Chamber: Satisfy IEC60068 Test Standard, Help Electronic Semiconductor Reliability Testing

In the field of electronics and semiconductors, a chip from design to mass production, need to break through countless reliability hurdles----especially automotive-grade, industrial-grade semiconductors, not only to withstand extreme cold, but also to withstand high temperatures, and in the repeated temperature changes to maintain stable performance. Sanwood's ESS Test Chamber, which meets the requirements of IEC60068 test standard, is a practical equipment to enhance the reliability of electronic semiconductor products.

IEC60068, as an internationally recognized environmental test standard, provides detailed provisions for temperature adaptation testing of semiconductor devices. Among them, Part 2-14 on the test requirements for temperature change focuses on the performance stability of devices in repeated temperature changes, such as switching from low to high temperatures and state retention under different temperature change rates.

Test requirements: 

1.Temperature Cycle Test: Through repeated high and low temperature cycles, test the performance stability of the device under drastic temperature changes, check whether there are problems such as solder joints falling off and material aging.

2.Temperature shock test: quickly switch between high and low temperature environments to test the device's ability to withstand rapid temperature changes, to avoid thermal expansion and contraction leading to internal structure damage.

3.High temperature test: Let the device work for a long time in a high temperature environment to evaluate its aging speed and performance degradation under continuous high temperature.

The basic parameters of the ESS Test Chamber of Sanwood:

Temperature control range: -70℃～+180℃ 

Temperature fluctuation: ±0.5℃ 

Cooling rate: +155.0℃～-55.0℃ 

(linear or non-linear:5.0℃, 10.0℃, 15.0℃, 20.0℃/min) 

Heating rate: -55.0℃～155.0℃ 

(linear or non-linear:5.0℃,10.0℃,15.0℃,20.0℃/min) 

Temperature uniformity: 1.5℃(-40.0℃～+100.0℃) 

2.0℃(+100.1℃～+180.0℃ or -40.0℃～-70.0℃)

For precision semiconductor devices, the stability of the test environment determines the validity of the data. Sanwood Technology has been specializing in the research, development and production of environmental test equipment, and its ESS Test Chamber has many advantages, which provides important help for the reliability testing of electronic semiconductors. In addition, it also has self-developed Altitude Test Chamber, Thermal Shock Test Chamber, High and Low Temperature Test Chamber and so on.

If you need to know more about professional testing solutions, please contact Sanwood , we will customize professional services for you.